Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale investigation, enabling detailed imaging and quantification of surface topography as well as mechanical properties.

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

The developed high-speed three-dimensional scanning force microscopy enabled the measurement of 3D force distribution at solid-liquid interfaces at 1.6 s/3D image. With this technique, 3D hydration ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

The AFM market is buoyed by demands in semiconductor miniaturization and nanotechnology research, requiring precise metrology solutions. Growth opportunities lie in automated AFM systems for yield ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...

Researchers at the Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, used high-speed atomic force microscopy to observe dynamic changes in AMPA receptors, which are vital for brain ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...

Polymer materials play an increasingly important role in a variety of industrial applications, thanks to their distinct physical and chemical properties. Among their key mechanical characteristics, ...