东京--(BUSINESS WIRE)--(美国商业资讯)--JEOL Ltd. (TOKYO:6951)（总裁兼首席执行官：Izumi Oi）宣布于2023年2月1日推出FIB-SEM系统“JIB-PS500i”。 随着先进材料结构愈发精细化和工艺愈发复杂化，形态观察、元素分析等评价技术对分辨率和精度提出了更高的要求。在半导体 ...

本文推荐研究人员针对双束FIB/SEM制备高质量S/TEM分析样品时保护层材料存在的导电性不足、易产生幕帘效应等问题，创新性地 ...

Today's scanning electron microscopes achieve ∼2-nm spot diameters at landing energies low enough that only the top few nanometers of the block's surface contributes substantially to the acquired ...

A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...

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Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...

TOKYO — JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023. With the finer structure of advanced materials and advancing ...

Figure 1.FIB-SEM cut through the layers of an MLCC electronic device. a) This high magnification view of a 10x20 μm area from the polished cross section appears to show a surface with minimal defects ...